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Journal description
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Details for article 51 of 98 found articles
| Title: |
Local structure determination of the Co-Si(111) interface by surface electron energy-loss fine-structure technique |
| Author: |
Chaînet, E. De Crescenzi, M. Derrien, J. Nguyen, T.T.A. Cinti, R.C. |
| Appeared in: |
Surface science letters |
| Paging: | Volume 168 (1986) nr. 1-3 pages 1 p. |
| Year: |
1986 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 51 of 98 found articles
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