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Journal description
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Details for article 14 of 98 found articles
| Title: |
Dependence of interface state density on the atomic roughness at the Si-SiO2 interface |
| Author: |
Hahn, PeterO. Yokohama, S. Henzler, M. |
| Appeared in: |
Surface science letters |
| Paging: | Volume 142 (1984) nr. 1-3 pages 1 p. |
| Year: |
1984 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 98 found articles
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