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Journal description
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Details for article 1 of 12 found articles
| Title: |
Appareillage pour l'etude “in situ” par diffraction des rayons X et mesure de la resistance electrique des depots metalliques realises a tres basse temperature |
| Author: |
Bererhi, A. Bosio, L. Cortes, R. Defrain, A. |
| Appeared in: |
Electrodeposition and surface treatment |
| Paging: | Volume 2 (1974) nr. 6 pages 6 p. |
| Year: |
1974 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 12 found articles
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