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Details for article 11 of 78 found articles
| Title: |
Carrier Activation at End-of-Range (EOR) Defects and Grain Boundaries in Boron-Doped Silicon |
| Author: |
Li, Yi-Yao Yang, Yu-Chen Chou, Tung-Huan Huang, Yu-Lin Chang, Chia-He Hsu, Ya-Lan Lin, Kun-Lin |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 54 () nr. 3 pages 2211-2218 |
| Year: |
2025-01-14 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 78 found articles
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