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                                       Details for article 5 of 45 found articles
 
 
  Changes in the Microstructure and Electrical Resistance of SnBi-Based Solder Joints during Current Stressing
 
 
Title: Changes in the Microstructure and Electrical Resistance of SnBi-Based Solder Joints during Current Stressing
Author: Flores, Javier
Panta, Sitaram
Hadian, Faramarz
Cotts, Eric
Appeared in: Journal of electronic materials
Paging: Volume 53 () nr. 3 pages 1299-1312
Year: 2024-01-12
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 5 of 45 found articles
 
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