|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 32 of 75 found articles
| Title: |
Evaluation of Strain-Relaxation of Carbon-Doped Silicon Nanowires and Its Crystal Orientation Dependence Using X-Ray Diffraction Reciprocal Space Mapping |
| Author: |
Yoshioka, Kazutoshi Hirosawa, Ichiro Watanabe, Takeshi Yokogawa, Ryo Ogura, Atsushi |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 52 () nr. 8 pages 5140-5149 |
| Year: |
2023-05-23 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 32 of 75 found articles
| << previous | next >> |