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Journal description
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Details for article 15 of 45 found articles
| Title: |
Gate Work Function-Engineered Graded-Channel Macaroni MOSFET: Exploration of Temperature and Localized Trapped Charge-Induced Effects with GIDL Analysis |
| Author: |
Banerjee, Pritha Das, Jayoti |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 51 () nr. 4 pages 1512-1523 |
| Year: |
2022-01-13 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 45 found articles
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