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                                       Details for article 13 of 45 found articles
 
 
  Encapsulant-Dependent Effects of Long-Term Low-Temperature Annealing on Interstitial Defects in Mg-Ion-Implanted GaN
 
 
Title: Encapsulant-Dependent Effects of Long-Term Low-Temperature Annealing on Interstitial Defects in Mg-Ion-Implanted GaN
Author: Akazawa, Masamichi
Murai, Shunta
Kachi, Tetsu
Appeared in: Journal of electronic materials
Paging: Volume 51 () nr. 4 pages 1731-1739
Year: 2022-02-03
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 13 of 45 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands