|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 32 of 70 found articles
| Title: |
Fabrication and Electrical Characterization of Ti/p-Si Metal Semiconductor Schottky Structures at Low Temperature |
| Author: |
Asil Uğurlu, H. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 51 () nr. 12 pages 7164-7172 |
| Year: |
2022-09-30 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 32 of 70 found articles
| << previous | next >> |