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Details for article 24 of 50 found articles
| Title: |
Modeling of High-Current Polycrystalline Silicon Thin Film Transistors by Incorporating Buried Electrode |
| Author: |
Zhang, Peng Jacques, Emmanuel Rogel, Regis Pichon, Laurent Bonnaud, Olivier |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 51 () nr. 10 pages 5635-5643 |
| Year: |
2022-07-28 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 24 of 50 found articles
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