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Effect of Ag Additives on the Consumption of a Cathode Cu Pad in a Cu/Sn3.5Ag/Cu Flip-Chip Structure Under Electromigration |
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Titel: |
Effect of Ag Additives on the Consumption of a Cathode Cu Pad in a Cu/Sn3.5Ag/Cu Flip-Chip Structure Under Electromigration |
Auteur: |
Lin, Y. X. Wang, J. Y. Chen, C. Y. Wu, C. Y. Chiu, C. Y. Lee, C. H. Yeh, C. Y. Huang, B. R. Chang, J. S. Yen, T. H. Fu, K. L. Liu, C. Y. |
Verschenen in: |
Journal of electronic materials |
Paginering: |
Jaargang 50 () nr. 12 pagina's 6584-6589 |
Jaar: |
2021-10-11 |
Inhoud: |
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Uitgever: |
Springer US, New York |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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