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Details for article 70 of 85 found articles
| Title: |
Statistical Prediction of Nanosized-Metal-Grain-Induced Threshold-Voltage Variability for 3D Vertically Stacked Silicon Gate-All-Around Nanowire n-MOSFETs |
| Author: |
Sung, Wen-Li Li, Yiming |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 49 () nr. 11 pages 6865-6871 |
| Year: |
2020-08-01 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 70 of 85 found articles
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