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Details for article 9 of 81 found articles
| Title: |
Behavior of SiNx/SiO2 Double Layer for Surface Passivation of Compensated p-Type Czochralski Silicon Wafers |
| Author: |
Maoudj, M. Bouhafs, D. Bourouba, N. El Amrani, A. Tahi, H. Hamida-Ferhat, A. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 48 (2019) nr. 6 pages 4025-4032 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 81 found articles
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