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Journal description
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Details for article 8 of 85 found articles
| Title: |
Anode-Side Failure of a Cuprous Oxide Semiconductor Caused by High-Density Current Loading |
| Author: |
Moriwaki, Takeshi Sasagawa, Kazuhiko Sugawara, Yusuke Fujisaki, Kazuhiro Mineta, Takahiro |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 48 (2019) nr. 11 pages 6949-6953 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 85 found articles
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