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                                       Details for article 11 of 102 found articles
 
 
  Characterization of Strain Due to Nitrogen Doping Concentration Variations in Heavy Doped 4H-SiC
 
 
Title: Characterization of Strain Due to Nitrogen Doping Concentration Variations in Heavy Doped 4H-SiC
Author: Yang, Yu
Guo, Jianqiu
Raghothamachar, Balaji
Chan, Xiaojun
Kim, Taejin
Dudley, Michael
Appeared in: Journal of electronic materials
Paging: Volume 47 (2017) nr. 2 pages 938-943
Year: 2017
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 11 of 102 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands