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Journal description
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Details for article 46 of 70 found articles
| Title: |
Microstructural Characterization and Electrical Properties of Ti–GaSb Junctions |
| Author: |
Lin, Kun-Lin Chen, Szu-Hung |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 45 (2016) nr. 11 pages 5679-5684 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 46 of 70 found articles
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