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                                       Details for article 7 of 86 found articles
 
 
  Chip to Chip Bonding Using Cu Bumps Capped with Thin Sn Layers and the Effect of Microstructure on the Shear Strength of Joints
 
 
Title: Chip to Chip Bonding Using Cu Bumps Capped with Thin Sn Layers and the Effect of Microstructure on the Shear Strength of Joints
Author: Kim, Yang Ho
Ma, Sung Woo
Kim, Young-Ho
Appeared in: Journal of electronic materials
Paging: Volume 43 (2014) nr. 9 pages 3296-3306
Year: 2014
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 7 of 86 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands