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Details for article 37 of 37 found articles
| Title: |
The Influence of Sn Orientation on Intermetallic Compound Evolution in Idealized Sn-Ag-Cu 305 Interconnects: an Electron Backscatter Diffraction Study of Electromigration |
| Author: |
Linares, Xioranny Kinney, Chris Lee, Kyu-Oh Morris, J. W. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 43 (2013) nr. 1 pages 43-51 |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 37 of 37 found articles
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