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Details for article 34 of 37 found articles
| Title: |
Structure–Property Correlations in CoFe–SiO2 Nanogranular Films Utilizing x-Ray Photoelectron Spectroscopy and Small-Angle Scattering Techniques |
| Author: |
Ohodnicki, P.R. Sokalski, V. Baltrus, J. Kortright, J.B. Zuo, X. Shen, S. DeGeorge, V. McHenry, M.E. Laughlin, D.E. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 43 (2013) nr. 1 pages 142-150 |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 34 of 37 found articles
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