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Journal description
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Details for article 1 of 177 found articles
| Title: |
Ab Initio Calculations and Measurements of Thermoelectric Properties of V2O5 Films |
| Author: |
Chumakov, Yu. Xiong, S.-Y. Santos, J. R. Ferreira, I. Termentzidis, K. Pokropivny, A. Cortona, P. Volz, S. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 42 (2012) nr. 7 pages 1597-1603 |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 177 found articles
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