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Journal description
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Details for article 19 of 20 found articles
| Title: |
Traps in 4H-SiC Field-Effect Transistors Characterized by Capacitance- and Current-Mode Deep-Level Transient Spectroscopy |
| Author: |
Fang, Z.-Q. Claflin, B. Look, D. C. Chai, F. Odekirk, B. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 40 (2011) nr. 11 pages 2179-2186 |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 20 found articles
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