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Details for article 1 of 44 found articles
| Title: |
Accurate Simulation of Temperature-Dependent Dark Current in HgCdTe Infrared Detectors Assisted by Analytical Modeling |
| Author: |
Hu, Weida Chen, Xiaoshuang Ye, Zhenhua Zhang, Jing Yin, Fei Lin, Chun Li, Zhifeng Lu, Wei |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 39 (2010) nr. 7 pages 981-985 |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 44 found articles
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