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Journal description
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Details for article 8 of 42 found articles
| Title: |
Defect Imaging in Laser Diodes by Mapping Their Near-Infrared Emission |
| Author: |
Tomm, Jens W. Ziegler, Mathias Kissel, Heiko Biesenbach, Jens |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 39 (2010) nr. 6 pages 723-726 |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 42 found articles
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