|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 6 of 22 found articles
| Title: |
Electrical and Optical Characterization of AlGaN/GaN HEMTs with In Situ and Ex Situ Deposited SiNx Layers |
| Author: |
Tadjer, Marko J. Anderson, Travis J. Hobart, Karl D. Mastro, Michael A. Hite, Jennifer K. Caldwell, Joshua D. Picard, Yoosuf N. Kub, Fritz J. Eddy, Charles R. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 39 (2010) nr. 11 pages 2452-2458 |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 22 found articles
| << previous | next >> |