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Journal description
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Details for article 4 of 26 found articles
| Title: |
Effect of Al-Trace Width on the Electromigration Failure Time of Flip-Chip Solder Joints |
| Author: |
Liang, S. W. Hsiao, H. Y. Chen, Chih |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 39 (2010) nr. 10 pages 2316-2323 |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 26 found articles
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