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Stability of Flip-Chip Interconnects Assembled with Al/Ni(V)/Cu-UBM and Eutectic Pb-Sn Solder During Exposure to High-Temperature Storage |
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Titel: |
Stability of Flip-Chip Interconnects Assembled with Al/Ni(V)/Cu-UBM and Eutectic Pb-Sn Solder During Exposure to High-Temperature Storage |
Auteur: |
Osenbach, J. Amin, A. Bachman, M. Baiocchi, F. Bitting, D. Crouthamel, D. DeLucca, J. Gerlach, D. Goodell, J. Peridier, C. Stahley, M. Weachock, R. |
Verschenen in: |
Journal of electronic materials |
Paginering: |
Jaargang 38 (2008) nr. 2 pagina's 303-324 |
Jaar: |
2008 |
Inhoud: |
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Uitgever: |
Springer US, Boston |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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