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                                       Details for article 9 of 27 found articles
 
 
  Fifteen-Nanometer Ru Diffusion Barrier on NiSi/Si for a sub-45 nm Cu Contact Plug
 
 
Title: Fifteen-Nanometer Ru Diffusion Barrier on NiSi/Si for a sub-45 nm Cu Contact Plug
Author: Lin, Jia-Huei
Lee, Jiing-Herng
Hsu, Chen-Sheng
Fang, Jau-Shiung
Appeared in: Journal of electronic materials
Paging: Volume 38 (2009) nr. 11 pages 2251-2256
Year: 2009
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 27 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands