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Journal description
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Details for article 9 of 21 found articles
| Title: |
Enhancement of Oxidation Resistance and Electrical Properties of Indium-Doped Copper Thin Films |
| Author: |
Hsu, C.S. Hsieh, H.Y. Fang, J.S. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 37 (2008) nr. 6 pages 852-859 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 21 found articles
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