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Journal description
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Details for article 2 of 21 found articles
| Title: |
Calibration of Electromigration Reliability of Flip-Chip Packages by Electrothermal Coupling Analysis |
| Author: |
Lai, Yi-Shao Kao, Chin-Li |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 37 (2008) nr. 6 pages 935 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 21 found articles
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