Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 33 of 41 found articles
 
 
  Simulation of Grazing-Incidence Synchrotron White Beam X-ray Topographic Images of Micropipes in 4H-SiC and Determination of Their Dislocation Senses
 
 
Title: Simulation of Grazing-Incidence Synchrotron White Beam X-ray Topographic Images of Micropipes in 4H-SiC and Determination of Their Dislocation Senses
Author: Chen, Yi
Dudley, Michael
Sanchez, Edward K.
MacMillan, Michael F.
Appeared in: Journal of electronic materials
Paging: Volume 37 (2007) nr. 5 pages 713-720
Year: 2007
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 33 of 41 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands