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Journal description
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Details for article 31 of 41 found articles
| Title: |
Scanning Ion Probe Studies of Silicon Implantation Profiles in AlGaN/GaN HEMT Heterostructures |
| Author: |
Kocan, M. Umana-Membreno, G.A. Kilburn, M.R. Fletcher, I.R. Recht, F. McCarthy, L. Mishra, U.K. Nener, B.D. Parish, G. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 37 (2007) nr. 5 pages 554-557 |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 31 of 41 found articles
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