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                                       Details for article 25 of 31 found articles
 
 
  Relaxation of InGaN thin layers observed by X-ray and transmission electron microscopy studies
 
 
Title: Relaxation of InGaN thin layers observed by X-ray and transmission electron microscopy studies
Author: Liliental-Weber, Z.
Benamara, M.
Washburn, J.
Domagala, J. Z.
Bak-Misiuk, J.
Piner, E. L.
Roberts, J. C.
Bedair, S. M.
Appeared in: Journal of electronic materials
Paging: Volume 30 (2001) nr. 4 pages 439-444
Year: 2001
Contents:
Publisher: Springer-Verlag, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 25 of 31 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands