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Journal description
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Details for article 19 of 20 found articles
| Title: |
Uniformity of deep levels in semi-insulating InP obtained by multiple-step wafer annealing |
| Author: |
Kuriyama, K. Ushiyama, K. Tsunoda, T. Uchida, M. Yokoyama, K. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 27 (1998) nr. 5 pages 462-465 |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Springer-Verlag, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 20 found articles
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