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Journal description
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Details for article 36 of 40 found articles
| Title: |
Study of contact resistivity, mechanical integrity, and thermal stability of Ti/Al and Ta/Al ohmic contacts to n-type GaN |
| Author: |
Luther, B. P. Mohney, S. E. Delucca, J. M. Karlicek, R. F. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 27 (1998) nr. 4 pages 196-199 |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Springer-Verlag, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 36 of 40 found articles
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