Effects of Rapid Thermal Annealing on the Device Characteristics of Quantum Well Infrared Photodetectors
Titel:
Effects of Rapid Thermal Annealing on the Device Characteristics of Quantum Well Infrared Photodetectors
Auteur:
Sengupta, D.K. Fang, W Malin, J.I. Curtis, A.P. Horton, T. Kuo, H.C. Turnbull, D. Lin, C.H. Li, J. Hsieh, K.C. Chuang, S.L. Adesida, I. Feng, M. Bishop, S.G Stillman, G.E. Gibson, J.M. Chen, H. Mazumder, J. Liu, H.C.