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                                       Details for article 4 of 14 found articles
 
 
  Characterization of polymeric thin films by low-damage secondary ion mass spectrometry
 
 
Title: Characterization of polymeric thin films by low-damage secondary ion mass spectrometry
Author: Campana, J.E.
DeCorpo, J.J.
Colton, R.J.
Appeared in: Applications of surface science
Paging: Volume 8 (1981) nr. 3 pages 6 p.
Year: 1981
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 14 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands