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Journal description
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Details for article 6 of 16 found articles
| Title: |
Further examination of the Si KLL Auger line in silicon nitride thin films |
| Author: |
Taylor, J.Ashley |
| Appeared in: |
Applications of surface science |
| Paging: | Volume 7 (1981) nr. 1-2 pages 17 p. |
| Year: |
1981 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 16 found articles
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