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Journal description
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Details for article 47 of 67 found articles
| Title: |
Recent progress in the nondestructive analysis of surfaces, thin films, and interfaces by spectroellipsometry |
| Author: |
Aspnes, D.E. |
| Appeared in: |
Applications of surface science |
| Paging: | Volume 22-23 (1985) nr. P2 pages 12 p. |
| Year: |
1985 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 47 of 67 found articles
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