|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 4 of 13 found articles
| Title: |
In-situ ellipsometric and XPS studies on RF sputter cleaning and re-oxidation of thin Nb films |
| Author: |
Ermolieff, A. Dugourd, H. |
| Appeared in: |
Applications of surface science |
| Paging: | Volume 20 (1985) nr. 3 pages 10 p. |
| Year: |
1985 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 13 found articles
| << previous | next >> |