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Journal description
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Details for article 18 of 21 found articles
| Title: |
Quantitative Auger electron spectroscopy and Rutherford backscattering of potassium-implanted silicon, silica and sodium trisilicate |
| Author: |
Burrow, Brad J. Armstrong, Neal R. Quinn, Rod K. Bunker, Bruce C. Arnold, George W. Salmi, Doug R. |
| Appeared in: |
Applications of surface science |
| Paging: | Volume 20 (1984) nr. 1-2 pages 14 p. |
| Year: |
1984 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 21 found articles
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