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Journal description
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Details for article 20 of 114 found articles
| Title: |
Backscattering correction to depth profiling of interfaces |
| Author: |
Vidal, R. Ferrón, J. Buitrago, R.H. |
| Appeared in: |
Applications of surface science |
| Paging: | Volume 20 (1984) nr. 1-2 pages 9 p. |
| Year: |
1984 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 114 found articles
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