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Journal description
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Details for article 111 of 123 found articles
| Title: |
The influence of radiation damage (microscopic causes) on the sensitivity of Auger electron spectroscopy and X-ray photoelectron spectroscopy |
| Author: |
Cazaux, Jacques |
| Appeared in: |
Applications of surface science |
| Paging: | Volume 20 (1985) nr. 4 pages 15 p. |
| Year: |
1985 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 111 of 123 found articles
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