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                                       Details for article 10 of 92 found articles
 
 
  A sensitive way to determine the thickness of thin carbon films by SEM
 
 
Title: A sensitive way to determine the thickness of thin carbon films by SEM
Author: Bentzon, M.D.
Eskildsen, S.S.
Nielsen, P.S.
Appeared in: Micron and microscopica acta
Paging: Volume 23 (1992) nr. 1-2 pages 2 p.
Year: 1992
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 92 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands