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Journal description
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Details for article 34 of 91 found articles
| Title: |
Electron microscopy of mean inner potential change across interfaces in electronic materials. |
| Author: |
Hugsted, B. Sivertsen, R. Gjønnes, J. Salomonsen, G. Taftø, J. |
| Appeared in: |
Micron and microscopica acta |
| Paging: | Volume 22 (1991) nr. 1-2 pages 2 p. |
| Year: |
1991 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 34 of 91 found articles
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