Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 33 of 40 found articles
 
 
  TEM characterisation of lopos structures for submicron CMOS technology
 
 
Title: TEM characterisation of lopos structures for submicron CMOS technology
Author: Romano-Rodríguez, Albert
Norström, Hans
Vanhellemont, Jan
Appeared in: Micron and microscopica acta
Paging: Volume 21 (1990) nr. 4 pages 2 p.
Year: 1990
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 33 of 40 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands