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                                       Details for article 4 of 13 found articles
 
 
  Caustic patterns combined with second and third order astigmatism in high resolution scanning electron microscopes
 
 
Title: Caustic patterns combined with second and third order astigmatism in high resolution scanning electron microscopes
Author: Kanaya, Koichi
Oho, Eisaku
Adachi, Koichi
Yamamoto, Yoshiaki
Doi, Hiroshi
Appeared in: Micron and microscopica acta
Paging: Volume 21 (1990) nr. 1-2 pages 57-68
Year: 1990
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 13 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands