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Journal description
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Details for article 1 of 11 found articles
| Title: |
A contamination reducing method by ion beam bombardment of the specimen in high resolution electron microscopy |
| Author: |
Kanaya, Koichi Oho, Eisaku Osaki, Nobuyoshi Oda, Tomohiko |
| Appeared in: |
Micron and microscopica acta |
| Paging: | Volume 19 (1988) nr. 3 pages 11 p. |
| Year: |
1988 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 11 found articles
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