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                                       Details for article 39 of 43 found articles
 
 
  Test-retest reliability of multi-parametric maps (MPM) of brain microstructure
 
 
Title: Test-retest reliability of multi-parametric maps (MPM) of brain microstructure
Author: Aye, Norman
Lehmann, Nico
Kaufmann, Jörn
Heinze, Hans-Jochen
Düzel, Emrah
Taubert, Marco
Ziegler, Gabriel
Appeared in: NeuroImage
Paging: Volume 256 () nr. C pages p.
Year: 2022
Contents:
Publisher: The Author(s)
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 39 of 43 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands