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Journal description
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Details for article 25 of 29 found articles
| Title: |
Stochastic inverse thermographic characterization of sub-pixel sized through cracks |
| Author: |
Earls, C.J. |
| Appeared in: |
Mechanical systems and signal processing |
| Paging: | Volume 30 (2012) nr. C pages 11 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 29 found articles
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