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Journal description
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Details for article 1 of 11 found articles
| Title: |
A Framework for Measuring Differences in Data Characteristics |
| Author: |
Ganti, Venkatesh Gehrke, Johannes Ramakrishnan, Raghu Loh, Wei-Yin |
| Appeared in: |
Journal of computer and system sciences |
| Paging: | Volume 64 (2002) nr. 3 pages 37 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science (USA) |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 11 found articles
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